Surface morphology
Elemental analysis
Texture analysis
Phase imaging
Orientation imaging
Zeiss Supra 35VP is equipped with a Field Emission gun has the following characteristics:
Accelerating Voltage: 0.1kV-30kV | Resolution: 1.7nm at 20kV at HV mode and 2.0nm at 30kV at LV mode
Can operate at high and low vacuum with and without metal film coating | Magnification up to 900,000X with 0.01kV step
Imaging Detectors: Annular-SE, ET-SE, VPSE, Centaurus BSED
Energy dispersive x-ray microanalysis system
Qualitative (point, line, mapping) elemental analysis | Point Quantitative standarless elemental analysis with PB/ZAF method
Quantitative mapping standarless analysis with PB/ZAF method |Quantitative point elemental analysis with standards using the φ(ρ,z) method
Zeiss Supra 35VP is equipped with a Field Emission gun has the following characteristics:
Accelerating Voltage: 0.1kV-30kV | Resolution: 1.7nm at 20kV at HV mode and 2.0nm at 30kV at LV mode
Can operate at high and low vacuum with and without metal film coating | Magnification up to 900,000X with 0.01kV step
Imaging Detectors: Annular-SE, ET-SE, VPSE, Centaurus BSED
Energy dispersive x-ray microanalysis system
Qualitative (point, line, mapping) elemental analysis | Point Quantitative standarless elemental analysis with PB/ZAF method
Quantitative mapping standarless analysis with PB/ZAF method |Quantitative point elemental analysis with standards using the φ(ρ,z) method