Structural analysis  |   Electron Microscopy
 
DESCRIPTION
The description of this service is not available.
FORTH – INSTITUTE OF CHEMICAL ENGINEERING SCIENCES
LOCATION:   Platani, Patra | http://www.iceht.forth.gr
RELEVANT STAFF:   Maria Klapa
SERVICE DETAILS:  

Surface morphology

Elemental analysis

Texture analysis

Phase imaging

Orientation imaging

RELEVANT EQUIPMENT:  
EQUIPMENT UNIT:  
FEG-SEM SUPRA 35VP by Carl Zeiss Microscopy GmBH
TYPE:   Scanning Electron Microscope
ADDITIONAL INFO:  
 
LOCATION:   X-ray diffraction & microscopy laboratory, FORTH/ICE-HT, Patras
DESCRIPTION:  

Zeiss Supra 35VP is equipped with a Field Emission gun has the following characteristics:

Accelerating Voltage: 0.1kV-30kV | Resolution: 1.7nm at 20kV at HV mode and 2.0nm at 30kV at LV mode

Can operate at high and low vacuum with and without metal film coating | Magnification up to 900,000X with 0.01kV step

Imaging Detectors: Annular-SE, ET-SE, VPSE, Centaurus BSED

Energy dispersive x-ray microanalysis system

Qualitative (point, line, mapping) elemental analysis | Point Quantitative standarless elemental analysis with PB/ZAF method

Quantitative mapping standarless analysis with PB/ZAF method |Quantitative point elemental analysis with standards using the φ(ρ,z) method


FUNDER:   General Secretariat for Research & Technology
 
 
RELEVANT EXPERTISE:  
UNIVERSITY OF CRETE
LOCATION:   Heraklion, Crete | http://en.uoc.gr/
RELEVANT STAFF:   Michael Kokkinidis
SERVICE DETAILS:   Not available.
RELEVANT EQUIPMENT:  
EQUIPMENT UNIT:  
Electron Microscopy Lab by
TYPE:  
ADDITIONAL INFO:  
 
LOCATION:  
DESCRIPTION:  
FUNDER:  
 
 
RELEVANT EXPERTISE: